Electron diffraction: a cost-efficient approach

A total cost of operations analysis reveals significant cost advantages of an electron diffractometer over X-ray and TEM instrumentation. We compiled a detailed comparative overview discovering potential savings contrasted to existing analytical methods.

While a traditional X-ray approach to diffraction may still be the most widespread and proven one, emerging application in electron or nano-crystallography will become more and more important (for more information please consider this scientific paper).

From a professional crystallographer’s point of view, the currently used TEM-based approaches are not practical. First, a full blown TEM is over-engineered for traditional and future diffraction applications. This is reflected in exorbitant investment pricing and elevated operating cost from a diffraction application point of view. Second, the TEM has its major qualities in imaging applications, which leads to a competitive situation with other researchers while accessing the machine.

A dedicated Electron Diffractometer combines the best of two worlds, the perfect rotation from X-ray diffraction and the electron beam to access the sub µm-regime. The ease-of-use of ELDICO’s instrumentation concept allows significantly higher efficiency in measurements: 1.600 samples per year (factor 4 higher than on X-ray) and cost per sample of roughly 170 EUR (80% lower compared to TEM) - strong arguments for the acquisition of a proper electron diffraction device.

Our detailed cost comparison overview will offer insights in regards to the unbeatable cost advantages of a dedicated electron diffractometer over X-ray and TEM-based approaches.

Download Cost Comparison Overview

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ELDICO Scientific, The Electron Diffraction Company, is a Swiss hardware company founded 2019 and is located in Switzerland Innovation Park Innovaare at the Paul Scherrer Institute (PSI), one of the world's leading research centers for natural and engineering sciences. ELDICO develops, produces and sells electron diffractometers for the analysis of solid compounds enabling industrial and scientific researchers to characterise hitherto unmeasurable nano-crystalline systems. So far conventional methods (X-ray) fail, because they require bigger crystal sizes, which are often difficult or even impossible to produce. With support of the Nano Argovia Programme and the Swiss Nanosience Insitute (SNI) the proof-of-concept was achieved in 2018 (ETH Zurich, C-CINA Basel) on scientifically and industrially relevant samples.